Structural and Optical Study of Ni-Cu thin films with the different copper percentage
کد مقاله : 1127-PHYCHEM23
نویسندگان
سمیرا گودرزی *
گروه فیزیک، دانشکده ملایر، دانشگاه ملایر، ملایر، ایران
چکیده مقاله
In this paper, we report co-deposition of RF-sputtering and RF-PECVD for growth of Ni NPs @ a-C: H with different percentages of Cu. We studied optical constants of Ni-Cu thin films, with constant Ni content and different percentages of 5%, 40%, and 75 % from Cu atoms. With the increase of Cu percentage, the RMS roughness of films was decreased. All films exhibit a reflectance and transmittance of about 20% and 50%, respectively.
کلیدواژه ها
thin films, Atomic Force Microscopy (AFM), Optical properties
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