Structural and Optical Study of Ni-Cu thin films with the different copper percentage |
کد مقاله : 1127-PHYCHEM23 |
نویسندگان |
سمیرا گودرزی * گروه فیزیک، دانشکده ملایر، دانشگاه ملایر، ملایر، ایران |
چکیده مقاله |
In this paper, we report co-deposition of RF-sputtering and RF-PECVD for growth of Ni NPs @ a-C: H with different percentages of Cu. We studied optical constants of Ni-Cu thin films, with constant Ni content and different percentages of 5%, 40%, and 75 % from Cu atoms. With the increase of Cu percentage, the RMS roughness of films was decreased. All films exhibit a reflectance and transmittance of about 20% and 50%, respectively. |
کلیدواژه ها |
thin films, Atomic Force Microscopy (AFM), Optical properties |
وضعیت: پذیرفته شده برای ارسال فایل های ارائه پوستر |